Quality Assurance Acquires State-Of-The-Art XRF Analyzer


The Microtech Quality Assurance Lab has added to their test equipment inventory a state-of-the-art Fischerscope Model XDLM 237 X-RAY Fluorescence Measuring Systems (XRF) plating thickness tester. This unit has a programmable XYZ stage for automated measurements. This unit also has 4 programmable collimators, (0.1mm, 0.2mm, 0.05x0.05mm and a 0.2x0.03mm) allowing for plating thickness measurements in smaller surface areas critical to our applications. This device can take multiple measurements in a fraction of the time with the ability to network and save data.      

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